<https://data.bnf.fr/ark:/12148/cb144419379> <http://data.bnf.fr/ontology/bnf-onto/FRBNF> "14441937"^^<http://www.w3.org/2001/XMLSchema#integer> .
<https://data.bnf.fr/ark:/12148/cb144419379> <http://rdaregistry.info/Elements/u/#P61160> <http://www.rdaregistry.info/termList/statIdentification/1001> .
<https://data.bnf.fr/ark:/12148/cb144419379> <http://purl.org/dc/terms/modified> "2009-11-18" .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://rdvocab.info/ElementsGr2/dateOfTermination> <https://data.bnf.fr/date/2001/> .
<https://data.bnf.fr/ark:/12148/cb144419379> <http://www.w3.org/2004/02/skos/core#exactMatch> <http://viaf.org/viaf/129268275/> .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://www.w3.org/2002/07/owl#sameAs> <http://viaf.org/viaf/129268275> .
<https://data.bnf.fr/ark:/12148/cb144419379> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.w3.org/2004/02/skos/core#Concept> .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://data.bnf.fr/ontology/bnf-onto/lastYear> "2001"^^<http://www.w3.org/2001/XMLSchema#integer> .
<https://data.bnf.fr/ark:/12148/cb389278668#Expression> <http://data.bnf.fr/vocabulary/roles/r70> <https://data.bnf.fr/ark:/12148/cb144419379#about> .
<https://data.bnf.fr/ark:/12148/cb144419379> <http://www.w3.org/2000/01/rdf-schema#seeAlso> <https://catalogue.bnf.fr/ark:/12148/cb144419379> .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://rdvocab.info/ElementsGr2/dateOfEstablishment> <https://data.bnf.fr/date/2001/> .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://data.bnf.fr/ontology/bnf-onto/firstYear> "2001"^^<http://www.w3.org/2001/XMLSchema#integer> .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://rdaregistry.info/Elements/a/#P50037> <https://data.bnf.fr/date/2001/> .
<https://data.bnf.fr/ark:/12148/cb144419379> <http://www.w3.org/2004/02/skos/core#prefLabel> "International workshop on thermal investigations of ICs and microstructures (07 ; 2001 ; Paris)"@en .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://xmlns.com/foaf/0.1/page> <https://data.bnf.fr/14441937/international_workshop_on_thermal_investigations_of_ics_and_microstructures/> .
<https://data.bnf.fr/ark:/12148/cb144419379> <http://purl.org/dc/terms/created> "2002-12-13" .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://xmlns.com/foaf/0.1/name> "International workshop on thermal investigations of ICs and microstructures (07 ; 2001 ; Paris)"@fr .
<https://data.bnf.fr/ark:/12148/cb389278668#Expression> <http://purl.org/dc/terms/contributor> <https://data.bnf.fr/ark:/12148/cb144419379#about> .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://xmlns.com/foaf/0.1/Organization> .
<https://data.bnf.fr/ark:/12148/cb389278668#Expression> <http://id.loc.gov/vocabulary/relators/aut> <https://data.bnf.fr/ark:/12148/cb144419379#about> .
<https://data.bnf.fr/ark:/12148/cb144419379> <http://xmlns.com/foaf/0.1/focus> <https://data.bnf.fr/ark:/12148/cb144419379#about> .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://www.w3.org/2002/07/owl#sameAs> <https://data.bnf.fr/ark:/12148/cb144419379#foaf:Organization> .
<https://data.bnf.fr/ark:/12148/cb144419379#about> <http://rdaregistry.info/Elements/a/#P50038> <https://data.bnf.fr/date/2001/> .